Photofragmentation of SiF4 upon Si 2p and F 1s Core Excitation: Cation and Anion Yield Spectroscopy

Authors

Maria Novella Piancastelli, Uppsala UniversityFollow
Wayne C. Stolte, University of Nevada, Las VegasFollow
Renaud Guillemin, CNRS, Laboratoire de Chimie Physique-Matière et RayonnementFollow
A. Wolska, Institute of Physics, Polish Academy of SciencesFollow
Dennis W. Lindle, University of Nevada, Las VegasFollow

Document Type

Article

Publication Date

2008

Publication Title

Journal of Chemical Physics

Volume

128

Issue

134309

First page number:

7

Abstract

We have studied the fragmentation dynamics of core-excited SiF₄ by means of soft-x-ray photoexcitation and partial positive and negative ion yield measurements around the Si L_2,3-shell and F K-shell ionization thresholds. All detectable ionic fragments are reported and we observe significant differences between the various partial ion yields near the Si 2p threshold. The differences are similar to our previous results from CH₃Cl showing more extended fragmentation in correspondence to transitions to Rydberg states. At variance with smaller systems, we observe negative ion production in the shape resonance region. This can be related to the possibility in a relatively large system to dissipate positive charge over several channels.

Keywords

Atomic orbitals; Electron configuration; Electronic excitation; Fragmentation reactions; Silane compounds

Disciplines

Analytical Chemistry | Atomic, Molecular and Optical Physics | Biological and Chemical Physics | Physical Chemistry

Language

English

Permissions

Copyright American Institute of Physics, used with permission

Repository Citation

Piancastelli, M. N., Stolte, W. C., Guillemin, R., Wolska, A., Lindle, D. W. (2008). Photofragmentation of SiF4 upon Si 2p and F 1s Core Excitation: Cation and Anion Yield Spectroscopy. Journal of Chemical Physics, 128(134309), 7.
https://digitalscholarship.unlv.edu/chem_fac_articles/17