Design and Performance of a Curved-crystal X-ray Emission Spectrometer

Authors

A. C. Hudson, University of Nevada, Las VegasFollow
Wayne C. Stolte, University of Nevada, Las VegasFollow
Dennis W. Lindle, University of Nevada, Las VegasFollow
Renaud Guillemin, CNRS, Laboratoire de Chimie Physique-Matière et RayonnementFollow

Document Type

Article

Publication Date

2007

Publication Title

Review of Scientific Instruments

Volume

78

Issue

053101

First page number:

6

Abstract

A curved-crystal x-ray emission spectrometer has been designed and built to measure 2–5 keV x-ray fluorescence resulting from a core-level excitation of gas phase species. The spectrometer can rotate 180°, allowing detection of emitted x rays with variable polarization angles, and is capable of collecting spectra over a wide energy range (20 eV wide with 0.5 eV resolution at the Cl K edge) simultaneously. In addition, the entire experimental chamber can be rotated about the incident-radiation axis by nearly 360° while maintaining vacuum, permitting measurements of angular distributions of emitted x rays.

Keywords

Spectrometer; Reviews

Disciplines

Atomic, Molecular and Optical Physics | Biological and Chemical Physics | Physical Chemistry

Language

English

Comments

DOI: 10.1063/1.2735933

Permissions

Copyright American Institute of Physics, used with permission

Repository Citation

Hudson, A. C., Stolte, W. C., Lindle, D. W., Guillemin, R. (2007). Design and Performance of a Curved-crystal X-ray Emission Spectrometer. Review of Scientific Instruments, 78(053101), 6.
https://digitalscholarship.unlv.edu/chem_fac_articles/18