Use of Sputtered Multilayers in a Double-crystal Monochromator

Authors

P. L. Cowan, Argonne National Laboratory
Dennis W. Lindle, University of Nevada, Las VegasFollow
S. H. Southworth, Argonne National Laboratory
B. A. Karlin, Brookhaven National LaboratoryFollow
Rupert C. Perera, Lawrence Berkeley National LaboratoryFollow

Document Type

Article

Publication Date

5-1990

Publication Title

Nuclear Instruments and Methods

Volume

A291

Issue

1-2

First page number:

219

Last page number:

220

Abstract

We report on the use of synthetic multilayers as diffracting elements in the double-crystal monochromator of an X-ray beamline to obtain focused, monochromatized synchrotron radiation below 1000 eV. A resolving power > 100 (ElΔE) was observed at the fluorine K edge (690 eV) and the copper L_2.3 edges (930–950 eV) as demonstrated by absorption spectra of thin films.

Keywords

Monochromator; Particle beams; Spectrum analysis — Instruments; Synchrotron radiation

Disciplines

Analytical Chemistry | Biological and Chemical Physics | Elementary Particles and Fields and String Theory | Physical Chemistry

Language

English

Permissions

Use Find in Your Library, contact the author, or use interlibrary loan to garner a copy of the article. Publisher copyright policy allows author to archive post-print (author’s final manuscript). When post-print is available or publisher policy changes, the article will be deposited

Repository Citation

Cowan, P. L., Lindle, D. W., Southworth, S. H., Karlin, B. A., Perera, R. C. (1990). Use of Sputtered Multilayers in a Double-crystal Monochromator. Nuclear Instruments and Methods, A291(1-2), 219-220.