An Easy Tune-up Exponentially Fast Annealer for High-quality Analog Module Placement

Document Type

Conference Proceeding

Publication Date

5-4-2008

Publication Title

Canadian Conference on Electrical and Computer Engineering

Publisher

IEEE

First page number:

547

Last page number:

550

Abstract

VLSI analog module placement problem is NP-complete, and both simulated Cauchy annealing and simulated Boltzmann annealing approaches are widely employed as the search engine nowadays. These approaches, however, exhibit low execution efficiency and pose high degree of difficulty in tuning. In this paper, we present a very fast simulated re-annealing placement algorithm for analog VLSI layout design. We show that this algorithm is exponentially faster than either Cauchy or Boltzmann annealing. The functionality of the re-annealing is to perform an adaptive control on the annealing schedules of multidimensional parameters. Moreover, a cell-slide-based flat placement style satisfying various symmetry constraints pertaining to analog layout design is developed to drastically reduce the solution space without degrading the search opportunities. The dedicated cost function covers the special requirements for analog integrated circuits, including area, wire length, aspect ratio, proximity, parasitic effects, etc. The proposed algorithm has been applied to layout several analog circuits, and it appears superior to the conventional approaches with significantly less amount of CPU time.

Keywords

Analogue integrated circuits; Circuit optimization; Computational complexity; Integrated circuit layout; Simulated annealing; VLSI

Disciplines

Controls and Control Theory | Electrical and Computer Engineering | Engineering | Signal Processing | Systems and Communications | VLSI and Circuits, Embedded and Hardware Systems

Language

English

Permissions

Use Find in Your Library, contact the author, or interlibrary loan to garner a copy of the item. Publisher policy does not allow archiving the final published version. If a post-print (author's peer-reviewed manuscript) is allowed and available, or publisher policy changes, the item will be deposited.

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