High-Resolution Electron Time-of-Flight Apparatus for the Soft-X-Ray Region

Authors

Oliver Hemmers, University of Nevada, Las VegasFollow
S. B. Whitfield, University of Wisconsin - Eau ClaireFollow
P. Glans, University of Nevada, Las VegasFollow
H. Wang, University of Nevada, Las VegasFollow
Dennis W. Lindle, University of Nevada, Las VegasFollow
R. Wehlitz, University of Tennessee, KnoxvilleFollow
I. A. Sellin, University of Tennessee - KnoxvilleFollow

Document Type

Article

Publication Date

11-1998

Publication Title

Review of Scientific Instruments

Publisher

American Institute of Physics

Volume

69

Issue

11

First page number:

3809

Last page number:

3817

Abstract

A gas-phase time-of-flight (TOF) apparatus, capable of supporting as many as six electron-TOF analyzers viewing the same interaction region, has been developed to measure energy- and angle-resolved electrons with kinetic energies up to 5 keV. Each analyzer includes a newly designed lens system that can retard electrons to about 2% of their initial kinetic energy without significant loss of transmission; the analyzers can thus achieve a resolving power (E/ΔE) greater than 10⁴ over a wide kinetic-energy range. Such high resolving power is comparable to the photon energy resolution of state-of-the-art synchrotron–radiation beamlines in the soft x-ray range, opening the TOF technique to numerous high-resolution applications. In addition, the angular placement of the analyzers, by design, permits detailed studies of nondipolar angular distribution effects in gas-phase photoemission.

Controlled Subject

Demodulation (Electronics); Photoelectron spectroscopy; Synchrotron radiation; Time-of-flight mass spectrometry

Disciplines

Atomic, Molecular and Optical Physics | Physical Chemistry

File Format

pdf

File Size

705 KB

Language

English

Comments

Also published in:

Advanced Light Source Compendium of User Abstracts and Technical Reports 1998, August 1999

Permissions

Copyright (1998) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

Rights

IN COPYRIGHT. For more information about this rights statement, please visit http://rightsstatements.org/vocab/InC/1.0/

Repository Citation

Hemmers, O., Whitfield, S. B., Glans, P., Wang, H., Lindle, D. W., Wehlitz, R., Sellin, I. A. (1998). High-Resolution Electron Time-of-Flight Apparatus for the Soft-X-Ray Region. Review of Scientific Instruments, 69(11), 3809-3817.
https://digitalscholarship.unlv.edu/hrc_fac_articles/38