The HRC Transmission Electron Microscope (TEM) facility provides state of the art high-resolution imaging services. In addition, the facility supports research and education in Chemistry, Material Sciences, Nuclear Technology, Metallurgy, Microbiology, and Polymer Science. The TEM is the primary method used to determine structural features such as crystal structure, interfaces, defects, and chemical identification. The device can characterize ceramics, metals, semiconductors, and biological materials, including radioactive materials, at resolutions down to atomic scale.

Follow

Submissions from 2008

Microscopic Characterization of Uranium Nitrides Synthesized by Oxidative Ammonolysis of Uranium Tetrafluoride, Chemistry of Materials, G. W. Chinthaka Silva, Charles B. Yeamans, Longzhou Ma, Gary S. Cerefice, Kenneth Czerwinski, and Alfred P. Sattelberger

Submissions from 2007

Defects characterization of welded specimens by transmission electron microscopy, Ajit K. Roy, S. Chanda, A. Ghosh, P. Kumar, and Longzhou Ma

Submissions from 2006

PDF

Isothermal Titration Calorimetry and Transmission Electron Microscopy of Main-Chain Viologen Polymer Containing Bromide as Counerions, Pradip K. Bhowmik, Marcos A. Cheney, Haesook Han, and Longzhou Ma

Synthesis and Characterization of inorganic double helices of cryptomelane nanomaterials, Marcos A. Cheney, Nancy R. Birkner, Longzhou Ma, Thomas Hartmann, Pradip K. Bhowmik, Vernon F. Hodge, and Spencer M. Steinberg

Reply to comment on “Identification of SAGBO-induced damage zone ahead of crack tip to characterize sustained loading crack growth in alloy 783”, Longzhou Ma, Xingbo LIu, and Keh-MInn Chang

Relationship of residual stress to dislocation density in cold-worked martensitic alloy, Ajit K. Roy, S. Bandyopadhyay, S. B. Suresh, D. Maitra, P. Kumar, D. Wells, and Longzhou Ma