Characterization of Electronic Board Material Properties Under Impact Loading
Document Type
Conference Proceeding
Publication Date
11-11-2008
Publication Title
Proceedings of the ASME 2007 International Mechanical Engineering Congress and Exposition: Mechanics of Solids and Structures
Publisher
ASME
Volume
10, pt. A
First page number:
531
Last page number:
538
Abstract
On-board electronics in advanced military apparatus are often subjected to severe ballistic shocks and vibrations. Safeguarding on-board electronic sensors from such transient shocks due to ballistic impact is of concern. While several studies document material characteristics of electronic boards under quasi-static and low impacts, few researchers addressed the behavior of these boards under severe impact loading. This paper presents the results of testing electronic boards under different strain rates to assess the effects of strain rates on modulus of elasticity of the boards. The results are used to suggest material models that can be used in finite element codes to accurately describe the behavior of these boards under impact loading.
Keywords
Detectors; Electronic apparatus and appliances; Electronics – Materials – Testing; Military supplies; Shock (Mechanics); Vibration
Disciplines
Electrical and Electronics | Materials Science and Engineering | Mechanics of Materials | Military and Veterans Studies
Language
English
Permissions
Use Find in Your Library, contact the author, or interlibrary loan to garner a copy of the item. Publisher policy does not allow archiving the final published version. If a post-print (author's peer-reviewed manuscript) is allowed and available, or publisher policy changes, the item will be deposited.
Repository Citation
Ayyaswamy, A. K.,
Sridharala, S.,
Trabia, M.,
O'Toole, B.,
Liu, Q.,
Chowdhury, M.
(2008).
Characterization of Electronic Board Material Properties Under Impact Loading.
Proceedings of the ASME 2007 International Mechanical Engineering Congress and Exposition: Mechanics of Solids and Structures, 10, pt. A
531-538.
ASME.
Comments
Conference held: Seattle, Washington, USA, November 11–15, 2007