Document Type
Conference Proceeding
Publication Date
3-2011
Publication Title
35th IEEE Photovoltaic Specialists Conference (PVSC '10)
Publisher
National Renewable Energy Laboratory
Publisher Location
Golden, CO
First page number:
1
Last page number:
7
Abstract
The correlation of stress-induced changes in the performance of laboratory-made CdTe solar cells with various 2nd and 3rd level metrics is discussed. The overall behavior of aggregated data showing how cell efficiency changes as a function of open-circuit voltage (Voc), shortcircuit current density (Jsc), and fill factor (FF) is explained using a two-diode, PSpice model in which degradation is simulated by systematically changing model parameters. FF shows the highest correlation with performance during stress, and is subsequently shown to be most affected by shunt resistance, recombination and in some cases voltage-dependent collection. Large decreases in Jsc as well as increasing rates of Voc degradation are related to voltage-dependent collection effects and catastrophic shunting respectively. Large decreases in Voc in the absence of catastrophic shunting are attributed to increased recombination. The relevance of capacitance derived data correlated with both Voc and FF is discussed.
Controlled Subject
Cadmium; Cadmium telluride; Solar cells; Photovoltaic cells--Research; Solar cells--Research; Solar energy; Strains and stresses
Disciplines
Oil, Gas, and Energy | Power and Energy
File Format
File Size
570 KB
Language
English
Rights
IN COPYRIGHT. For more information about this rights statement, please visit http://rightsstatements.org/vocab/InC/1.0/
Repository Citation
Albin, D. S.,
del Cueto, J. A.,
Demtsu, S. H.,
Bansal, S.
(2011).
Use of 2nd and 3rd Level Correlation Analysis for Studying Degradation in Polycrystalline Thin-Film Solar Cells.
35th IEEE Photovoltaic Specialists Conference (PVSC '10)
1-7.
Available at:
https://digitalscholarship.unlv.edu/renew_pubs/49
Comments
Presented at the 35th IEEE Photovoltaic Specialists Conference (PVSC '10), June 20-25, 2010, Honolulu, Hawaii.