Title

Use of Sputtered Multilayers in a Double-crystal Monochromator

Document Type

Article

Publication Date

5-1990

Publication Title

Nuclear Instruments and Methods

Volume

A291

Issue

1-2

First page number:

219

Last page number:

220

Abstract

We report on the use of synthetic multilayers as diffracting elements in the double-crystal monochromator of an X-ray beamline to obtain focused, monochromatized synchrotron radiation below 1000 eV. A resolving power > 100 (ElΔE) was observed at the fluorine K edge (690 eV) and the copper L2.3 edges (930–950 eV) as demonstrated by absorption spectra of thin films.

Keywords

Monochromator; Particle beams; Spectrum analysis — Instruments; Synchrotron radiation

Disciplines

Analytical Chemistry | Biological and Chemical Physics | Elementary Particles and Fields and String Theory | Physical Chemistry

Language

English

Permissions

Use Find in Your Library, contact the author, or use interlibrary loan to garner a copy of the article. Publisher copyright policy allows author to archive post-print (author’s final manuscript). When post-print is available or publisher policy changes, the article will be deposited

Identifier

DOI: http://dx.doi.org/10.1016/0168-9002(90)90063-C

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