Performance Characteristics of Beamline 6.3.1 from 200 eV to 2000 eV at the Advanced Light Source

Authors

Ponnusamy Nachimuthu, University of Nevada, Las VegasFollow
J. H. Underwood, Lawrence Berkeley National LaboratoryFollow
C. D. Kemp, Lawrence Berkeley National Laboratory
Eric M. Gullikson, Lawrence Berkeley National LaboratoryFollow
Dennis W. Lindle, University of Nevada, Las VegasFollow
David K. Shuh, Lawrence Berkeley National LaboratoryFollow
Rupert C. Perera, Lawrence Berkeley National LaboratoryFollow

Document Type

Conference Proceeding

Publication Date

2004

Publication Title

Proceedings of the Eighth International Conference on Synchrotron Radiation Instrumentation

Publisher

American Institute of Physics

Volume

705

First page number:

454

Last page number:

457

Abstract

Bend magnet beamline 6.3.1 at the Advanced Light Source operates from 200 eV to 2000 eV, primarily used for x-ray absorption fine structure investigations. The beamline optics consist of a compact, entrance-slitless, Hettrick-Underwood type variable-line-spacing plane-grating monochromator and refocusing mirrors to provide a 25 μm × 500 μm spot at the focal point in the reflectometer end station. Wavelength is scanned by the simple rotation of the grating and illuminates a fixed exit slit. The LabView based beamline control and data acquisition computer code has been implemented to provide a convenient interface to the user. The dedicated end station is a reflectometer that is isolated from the beamline by a differential ion pump. The reflectometer can position samples to within 4 μm with an angular position of 0.002°, has total electron and fluorescence yield detectors, and pumps down in about 30 minutes. External end stations can be mounted downstream of the reflectometer as well. The versatility and simplicity of beamline 6.3.1 have made it useful for a wide range of applications such as the characterization of optical components, reflective coatings, and the investigation of a diverse range of materials in both the solid state and in solution.

Keywords

Nuclear physics — Instruments; Particle accelerators; Particle beams; Spectrum analysis — Instruments; Storage rings; Synchrotrons; Synchrotron radiation instrumentation

Disciplines

Analytical Chemistry | Atomic, Molecular and Optical Physics | Biological and Chemical Physics | Elementary Particles and Fields and String Theory | Physical Chemistry

Language

English

Comments

Edited by T. Warwick etal.

Permissions

Copyright American Institute of Physics, used with permission

Repository Citation

Nachimuthu, P., Underwood, J. H., Kemp, C. D., Gullikson, E. M., Lindle, D. W., Shuh, D. K., Perera, R. C. (2004). Performance Characteristics of Beamline 6.3.1 from 200 eV to 2000 eV at the Advanced Light Source. Proceedings of the Eighth International Conference on Synchrotron Radiation Instrumentation, 705 454-457. American Institute of Physics.
https://digitalscholarship.unlv.edu/chem_fac_articles/82