Facial Expression Recognition with Convolutional Neural Networks
Document Type
Conference Proceeding
Publication Date
1-6-2020
Publication Title
2020 10th Annual Computing and Communication Workshop and Conference (CCWC)
Publisher
Institute of Electronics and Electrical Engineers
Publisher Location
Las Vegas, NV
First page number:
324
Last page number:
328
Abstract
Emotions are a powerful tool in communication and one way that humans show their emotions is through their facial expressions. One of the challenging and powerful tasks in social communications is facial expression recognition, as in non-verbal communication, facial expressions are key. In the field of Artificial Intelligence, Facial Expression Recognition (FER) is an active research area, with several recent studies using Convolutional Neural Networks (CNNs). In this paper, we demonstrate the classification of FER based on static images, using CNNs, without requiring any pre-processing or feature extraction tasks. The paper also illustrates techniques to improve future accuracy in this area by using pre-processing, which includes face detection and illumination correction. Feature extraction is used to extract the most prominent parts of the face, including the jaw, mouth, eyes, nose, and eyebrows. Furthermore, we also discuss the literature review and present our CNN architecture, and the challenges of using max-pooling and dropout, which eventually aided in better performance. We obtained a test accuracy of 61.7% on FER2013 in a seven-classes classification task compared to 75.2% in state-of-the-art classification.
Keywords
Facial Expression Recognition (FER); Convolutional Neural Networks (CNNs); Artificial Intelligence (AI); Facial Action Coding System (FACS); Pre-processing; Feature Extraction
Disciplines
Artificial Intelligence and Robotics
Language
English
Repository Citation
Singh, S.,
Nasoz, F.
(2020).
Facial Expression Recognition with Convolutional Neural Networks.
2020 10th Annual Computing and Communication Workshop and Conference (CCWC)
324-328.
Las Vegas, NV: Institute of Electronics and Electrical Engineers.
http://dx.doi.org/10.1109/CCWC47524.2020.9031283