Title

Mining of Frequent Patterns with Multiple Minimum Supports

Document Type

Article

Publication Date

4-1-2017

Publication Title

Engineering Applications of Artificial Intelligence

Volume

60

First page number:

83

Last page number:

96

Abstract

Frequent pattern mining (FPM) is an important topic in data mining for discovering the implicit but useful information. Many algorithms have been proposed for this task but most of them suffer from an important limitation, which relies on a single uniform minimum support threshold as the sole criterion to identify frequent patterns (FPs). Using a single threshold value to assess the usefulness of all items in a database is inadequate and unfair in real-life applications since each item is different and not all items should be treated as the same. Several algorithms have been developed for mining FPs with multiple minimum supports but most of them suffer from the time-consuming problem and require a large amount of memory. In this paper, we address this issue by introducing the novel approach named Frequent Pattern mining with Multiple minimum supports from the Enumeration-tree (FP-ME). In the developed Set-Enumeration-tree with Multiple minimum supports (ME-tree) structure, a new sorted downward closure (SDC) property of FPs and the least minimum support (LMS) concept with multiple minimum supports are used to effectively prune the search space. The proposed FP-ME algorithm can directly discover FPs from the ME-tree without candidate generation. Moreover, an improved algorithm, named FP-MEDiffSet, is also developed based on the DiffSet concept, to further increase mining performance. Substantial experiments on both real-life and synthetic datasets show that the proposed algorithms can not only avoid the “rare item problem”, but also efficiently and effectively discover the complete set of FPs in transactional databases while considering multiple minimum supports and outperform the state-of-the-art CFP-growth++ algorithm in terms of execution time, memory usage and scalability

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