A new Method of Detecting Microcalcification Clusters for Computer Aided Digital Mammography
Document Type
Conference Proceeding
Publication Date
2008
Publication Title
Proceedings of 19th International Conference on Systems Engineering, ICSEng 2008
Publisher
IEEE
First page number:
532
Last page number:
537
Abstract
Digital mammograms are processed for detecting microcalcification clusters (MCCs) and prompting radiologists on their locations without specifying their type, i.e., benign, normal or malignant. The method includes image segmentation using SUSAN edge detector followed by the shape filters. Then the objects are classified with a four-level feed-forward Neural Network with four input features comprising perimeter and other three characterizing foreground-background relation. MCCs are found using the distance and the object count spatial filters. This simple yet robust system is capable to detect MC clusters with 98.4% of true positives at no false positive cases. The trial is performed on 118 mammograms from the DDSM database. It is shown in the paper that the reported performance is achieved due to the outstanding property of the edge detector to capture objects in a closed contour fashion; an efficient classifier, and significant features characterizing MCCs' geometry and intensities with respect to the background.
Keywords
Cancer; Edge detection; Image segmentation; Mammography; Medical diagnostic computing; Neural nets; Spatial filters
Disciplines
Computer Engineering | Electrical and Computer Engineering | Engineering
Language
English
Permissions
Use Find in Your Library, contact the author, or interlibrary loan to garner a copy of the item. Publisher policy does not allow archiving the final published version. If a post-print (author's peer-reviewed manuscript) is allowed and available, or publisher policy changes, the item will be deposited.
Repository Citation
Veni, G.,
Regentova, E.,
Mandava, A. K.
(2008).
A new Method of Detecting Microcalcification Clusters for Computer Aided Digital Mammography.
Proceedings of 19th International Conference on Systems Engineering, ICSEng 2008
532-537.
IEEE.