Fast Transient Digitizer Chip for Capturing Single-shot Events
Document Type
Conference Proceeding
Publication Date
1-1-2016
Publication Title
2016 IEEE Dallas Circuits and Systems Conference, DCAS 2016
Publisher
Institute of Electrical and Electronics Engineers Inc.
Abstract
An externally triggered analog sampling circuit used as an alternative to a high speed analog-to-digital converter (ADC) in microcontroller systems is designed, fabricated and characterized. High speed ADCs are expensive in terms of cost and power dissipation, the fast transient digitizer (FTD) is a low cost alternative and has no appreciable DC power dissipation. The transient digitizer uses cells with a process dependent delay element to sample data onto hold capacitors. The hold capacitor drives a PMOS source follower that is activated by an NMOS switch. The switch is controlled by on-chip logic that reads each sample sequentially in conjunction with an external counter. The FTD can capture an input signal with a maximum duration of 25 ns and an input range of 0 V to 2 V. The output is a reconstruction of the input signal on a timescale up to a few hundred μs. Two FTD circuits are fabricated on a 1.5 mm × 1.5 mm die using a 500 nm CMOS process; one FTD circuit occupies an area of 1.057 mm × 0.461 mm on the die. © 2016 IEEE.
Language
English
Repository Citation
Buck, K.,
Baker, R.
(2016).
Fast Transient Digitizer Chip for Capturing Single-shot Events.
2016 IEEE Dallas Circuits and Systems Conference, DCAS 2016
Institute of Electrical and Electronics Engineers Inc..
http://dx.doi.org/10.1109/DCAS.2016.7791149