Title

Fast transient digitizer chip for capturing single-shot events

Document Type

Conference Proceeding

Publication Date

1-1-2016

Publication Title

2016 IEEE Dallas Circuits and Systems Conference, DCAS 2016

Publisher

Institute of Electrical and Electronics Engineers Inc.

Abstract

An externally triggered analog sampling circuit used as an alternative to a high speed analog-to-digital converter (ADC) in microcontroller systems is designed, fabricated and characterized. High speed ADCs are expensive in terms of cost and power dissipation, the fast transient digitizer (FTD) is a low cost alternative and has no appreciable DC power dissipation. The transient digitizer uses cells with a process dependent delay element to sample data onto hold capacitors. The hold capacitor drives a PMOS source follower that is activated by an NMOS switch. The switch is controlled by on-chip logic that reads each sample sequentially in conjunction with an external counter. The FTD can capture an input signal with a maximum duration of 25 ns and an input range of 0 V to 2 V. The output is a reconstruction of the input signal on a timescale up to a few hundred μs. Two FTD circuits are fabricated on a 1.5 mm × 1.5 mm die using a 500 nm CMOS process; one FTD circuit occupies an area of 1.057 mm × 0.461 mm on the die. © 2016 IEEE.

Language

English

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