Applications of electron channeling contrast imaging (ECCI) in failure analysis of in-situ synchrotron X-ray diffraction deformation experiment

Authors

Shrin Kaboli, University of Nevada, Las Vegas
Pamela C. Burnley, University of Nevada, Las VegasFollow

Document Type

Article

Publication Date

8-4-2017

Publication Title

Proceedings of Microscopy & Microanalysis

Volume

23

Issue

S1

First page number:

568

Last page number:

569

Language

eng

Repository Citation

Kaboli, S., Burnley, P. C. (2017). Applications of electron channeling contrast imaging (ECCI) in failure analysis of in-situ synchrotron X-ray diffraction deformation experiment. Proceedings of Microscopy & Microanalysis, 23(S1), 568-569.
http://dx.doi.org/10.1017/S143192761700352X