Quantitative Characterization of Crystal Defects in Planetary Materials in a Scanning Electron Microscope (SEM)

Authors

Shirin Kaboli, University of Nevada, Las VegasFollow
Pamela C. Burnley, University of Nevada, Las VegasFollow

Document Type

Abstract

Publication Date

8-1-2018

Publication Title

Microscopy and Microanalysis

Volume

24

Issue

S1

First page number:

2094

Last page number:

2095

Disciplines

Cosmochemistry

Language

English

Repository Citation

Kaboli, S., Burnley, P. C. (2018). Quantitative Characterization of Crystal Defects in Planetary Materials in a Scanning Electron Microscope (SEM). Microscopy and Microanalysis, 24(S1), 2094-2095.
http://dx.doi.org/10.1017/s1431927618010954