Title
Angle Resolved Resonant Raman Auger Spectroscopy of the Xe 4d → 6p Transition
Document Type
Chapter
Publication Date
1997
Publication Title
Application of Accelerators in Research and Industry
Publisher
American Institute of Physics
Volume
392
First page number:
161
Last page number:
164
Abstract
We studied the angular distributions and decay rates of the Xe 4d5/2→6p resonant Auger lines using the high resolution and high flux of undulator beamline 9.0.1 at the Advanced Light Source. The electron spectra were recorded by two time-of-flight (TOF) spectrometers with energy resolutions as low as to 43 meV. This made it possible to determine the angular distribution parameters β of almost all possible final ionic 5p4(3P,1D,1S)6p states. A variation of the β parameter in an energy scan over the resonance shows evidence for a possible interference of the resonant with the nonresonant path way to the 5p4(3P)6p(2P3/2) final state.
Keywords
Angular distribution (Nuclear physics); Auger effect; Photoionization; Resonance Raman scattering
Disciplines
Atomic, Molecular and Optical Physics | Nuclear
Language
English
Permissions
Use Find in Your Library, contact the author, or use interlibrary loan to garner a copy of the article. Publisher copyright policy allows author to archive post-print (author’s final manuscript). When post-print is available or publisher policy changes, the article will be deposited.
Repository Citation
Langer, B.,
Farhat, A.,
Nessar, B.,
Berrah, N.,
Hemmers, O.,
Bozek, J.
(1997).
Angle Resolved Resonant Raman Auger Spectroscopy of the Xe 4d → 6p Transition.
Application of Accelerators in Research and Industry, 392
161-164.
Comments
Presented at: The fourteenth international conference on the application of accelerators in research and industry, 6-9 Nov 1996, Denton, Texas (USA)