Title
Angle Resolved Resonant Raman Auger Spectroscopy of the Xe 4d → 6p Transition
Document Type
Chapter
Publication Date
1997
Publication Title
Application of Accelerators in Research and Industry
Publisher
American Institute of Physics
Volume
392
First page number:
161
Last page number:
164
Abstract
We studied the angular distributions and decay rates of the Xe 4d5/2→6p resonant Auger lines using the high resolution and high flux of undulator beamline 9.0.1 at the Advanced Light Source. The electron spectra were recorded by two time-of-flight (TOF) spectrometers with energy resolutions as low as to 43 meV. This made it possible to determine the angular distribution parameters β of almost all possible final ionic 5p4(3P,1D,1S)6p states. A variation of the β parameter in an energy scan over the resonance shows evidence for a possible interference of the resonant with the nonresonant path way to the 5p4(3P)6p(2P3/2) final state.
Controlled Subject
Angular distribution (Nuclear physics); Auger effect; Photoionization; Raman effect, Resonance
Disciplines
Atomic, Molecular and Optical Physics | Nuclear
Language
English
Permissions
Use Find in Your Library, contact the author, or use interlibrary loan to garner a copy of the article. Publisher copyright policy allows author to archive post-print (author’s final manuscript). When post-print is available or publisher policy changes, the article will be deposited.
Rights
IN COPYRIGHT. For more information about this rights statement, please visit http://rightsstatements.org/vocab/InC/1.0/
Repository Citation
Langer, B.,
Farhat, A.,
Nessar, B.,
Berrah, N.,
Hemmers, O.,
Bozek, J.
(1997).
Angle Resolved Resonant Raman Auger Spectroscopy of the Xe 4d → 6p Transition.
Application of Accelerators in Research and Industry, 392
161-164.
Comments
Presented at: The fourteenth international conference on the application of accelerators in research and industry, 6-9 Nov 1996, Denton, Texas (USA)