Document Type

Report

Publication Date

11-2002

Abstract

We continued with sputter depth profiling of 316 and 316L steel samples that have been exposed to LBE. We also calibrated the sputter depth profiling using a sample of SiO2 on Si, and the SEM. This is a valuable independent determination of the thickness of oxide layers.

In the laboratory, progress continues using the XPS machine. Experiments have been performed on steel samples using Argon ions to mill away the surface of the sample, thereby making measurements as a function of depth. This "ion beam milling" proceeds slowly through the oxide layer that covers the steel sample. We are making measurements of samples with apparently quite thick oxide layers. We cannot mill any faster without causing damage to the vacuum pumps of the XPS instrument.

Keywords

Corrosion and anti-corrosives; Eutectic alloys; Lead-bismuth alloys; Lead-bismuth eutectic; Particle accelerators — Design and construction; Steel — Corrosion

Disciplines

Materials Chemistry | Metallurgy | Nuclear | Nuclear Engineering

Language

English


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