High-pressure-assisted X-ray-induced Damage as a New Route for Chemical and Structural Synthesis

Authors

Egor Evlyukhin, University of Nevada, Las VegasFollow
Eunja Kim, University of Nevada, Las VegasFollow
David Goldberger, University of Nevada, Las Vegas
Petrika Cifligu, University of Nevada, Las Vegas
Sarah Schyck, University of Nevada, Las Vegas
Philippe F. Weck, University of Nevada, Las VegasFollow
Michael Pravica, University of Nevada, Las VegasFollow

Document Type

Article

Publication Date

5-22-2018

Publication Title

Physical Chemistry Chemical Physics

Volume

20

Issue

28

First page number:

1

Last page number:

8

Abstract

X-ray induced damage has been known for decades and has largely been viewed as a tremendous nuisance. We, on the other hand, harness the highly ionizing and penetrating properties of hard X-rays to initiate novel decomposition and synthetic chemistry… See full text for full abstract.

Disciplines

Chemistry | Physics

Language

English

Repository Citation

Evlyukhin, E., Kim, E., Goldberger, D., Cifligu, P., Schyck, S., Weck, P. F., Pravica, M. (2018). High-pressure-assisted X-ray-induced Damage as a New Route for Chemical and Structural Synthesis. Physical Chemistry Chemical Physics, 20(28), 1-8.
http://dx.doi.org/10.1039/C8CP02119H