Angstrom-Resolved Interfacial Structure in Buried Organic-Inorganic Junctions

Authors

Craig P. Schwartz, Lawrence Berkeley National Laboratory, BerkeleyFollow
Sumana L. Raj, University of California, Berkeley
Sasawat Jamnuch, University of California, San Diego
Chris J. Hull, University of California, Berkeley
Paolo Miotti, University of Padova, Italy
Royce K. Lam, University of California, Berkeley
Dennis Nordlund, SLAC National Accelerator Laboratory, Menlo Park
Can B. Uzundal, University of California, Berkeley
Chaitanya Das Pemmaraju, Stanford Institute for Materials and Energy Sciences, Menlo Park
Riccardo Mincigrucci, Elettra-Sincrotrone Trieste, Italy
Laura Foglia, Elettra-Sincrotrone Trieste, Italy
Alberto Simoncig, Elettra-Sincrotrone Trieste, Italy
Marcello Coreno, Istituto di Struttura della Materia, Trieste, Italy
Claudio Masciovecchio, Elettra-Sincrotrone Trieste, Italy
Luca Poletto, National Research Council of Italy, Padova
Emiliano Principi, Elettra-Sincrotrone Trieste, Trieste, Italy
Tod A. Pascal, University of California, San Diego
Walter S. Drisdell, University of California, Berkeley
Richard J. Saykally, University of California, Berkeley

Document Type

Article

Publication Date

8-24-2021

Publication Title

Physical Review Letters

Volume

127

Issue

9

First page number:

1

Last page number:

6

Abstract

Charge transport processes at interfaces play a crucial role in many processes. Here, the first soft x-ray second harmonic generation (SXR SHG) interfacial spectrum of a buried interface (boron–Parylene N) is reported. SXR SHG shows distinct spectral features that are not observed in x-ray absorption spectra, demonstrating its extraordinary interfacial sensitivity. Comparison to electronic structure calculations indicates a boron-organic separation distance of 1.9 Å, with changes of less than 1 Å resulting in easily detectable SXR SHG spectral shifts (ca. hundreds of milli-electron volts).

Controlled Subject

X-rays; Electronic structure

Disciplines

Electrical and Electronics | Statistical, Nonlinear, and Soft Matter Physics

Repository Citation

Schwartz, C. P., Raj, S. L., Jamnuch, S., Hull, C. J., Miotti, P., Lam, R. K., Nordlund, D., Uzundal, C. B., Pemmaraju, C. D., Mincigrucci, R., Foglia, L., Simoncig, A., Coreno, M., Masciovecchio, C., Poletto, L., Principi, E., Pascal, T. A., Drisdell, W. S., Saykally, R. J. (2021). Angstrom-Resolved Interfacial Structure in Buried Organic-Inorganic Junctions. Physical Review Letters, 127(9), 1-6.
http://dx.doi.org/10.1103/PhysRevLett.127.096801