Title

Angstrom-Resolved Interfacial Structure in Buried Organic-Inorganic Junctions

Document Type

Article

Publication Date

8-24-2021

Publication Title

Physical Review Letters

Volume

127

Issue

9

First page number:

1

Last page number:

6

Abstract

Charge transport processes at interfaces play a crucial role in many processes. Here, the first soft x-ray second harmonic generation (SXR SHG) interfacial spectrum of a buried interface (boron–Parylene N) is reported. SXR SHG shows distinct spectral features that are not observed in x-ray absorption spectra, demonstrating its extraordinary interfacial sensitivity. Comparison to electronic structure calculations indicates a boron-organic separation distance of 1.9 Å, with changes of less than 1 Å resulting in easily detectable SXR SHG spectral shifts (ca. hundreds of milli-electron volts).

Controlled Subject

X-rays; Electronic structure

Disciplines

Electrical and Electronics | Statistical, Nonlinear, and Soft Matter Physics

UNLV article access

Search your library

Share

COinS