Use of 2nd and 3rd Level Correlation Analysis for Studying Degradation in Polycrystalline Thin-Film Solar Cells

Authors

David S. Albin, National Renewable Energy LaboratoryFollow
Joseph A. del Cueto, National Renewable Energy Laboratory
S. H. Demtsu, Primestar Solar
S. Bansal, GE Global Research Center

Document Type

Conference Proceeding

Publication Date

3-2011

Publication Title

35th IEEE Photovoltaic Specialists Conference (PVSC '10)

Publisher

National Renewable Energy Laboratory

Publisher Location

Golden, CO

First page number:

1

Last page number:

7

Abstract

The correlation of stress-induced changes in the performance of laboratory-made CdTe solar cells with various 2^nd and 3^rd level metrics is discussed. The overall behavior of aggregated data showing how cell efficiency changes as a function of open-circuit voltage (V_oc), shortcircuit current density (J_sc), and fill factor (FF) is explained using a two-diode, PSpice model in which degradation is simulated by systematically changing model parameters. FF shows the highest correlation with performance during stress, and is subsequently shown to be most affected by shunt resistance, recombination and in some cases voltage-dependent collection. Large decreases in J_sc as well as increasing rates of V_oc degradation are related to voltage-dependent collection effects and catastrophic shunting respectively. Large decreases in V_oc in the absence of catastrophic shunting are attributed to increased recombination. The relevance of capacitance derived data correlated with both V_oc and FF is discussed.

Controlled Subject

Cadmium; Cadmium telluride; Solar cells; Photovoltaic cells--Research; Solar cells--Research; Solar energy; Strains and stresses

Disciplines

Oil, Gas, and Energy | Power and Energy

File Format

pdf

File Size

570 KB

Language

English

Comments

Presented at the 35^th IEEE Photovoltaic Specialists Conference (PVSC '10), June 20-25, 2010, Honolulu, Hawaii.

Rights

IN COPYRIGHT. For more information about this rights statement, please visit http://rightsstatements.org/vocab/InC/1.0/

Repository Citation

Albin, D. S., del Cueto, J. A., Demtsu, S. H., Bansal, S. (2011). Use of 2nd and 3rd Level Correlation Analysis for Studying Degradation in Polycrystalline Thin-Film Solar Cells. 35th IEEE Photovoltaic Specialists Conference (PVSC '10) 1-7.
Available at: https://digitalscholarship.unlv.edu/renew_pubs/49