Award Date

1-1-1996

Degree Type

Dissertation

Degree Name

Doctor of Philosophy (PhD)

Department

Physics

Number of Pages

99

Abstract

A new method is developed that combines the production of ions by laser ablation with a reflection time-of-flight mass spectrometer (RTOFMS) for charge-transfer cross section measurements. This method allows a specific charge-transfer channel of an ion-neutral pair to be measured at energies of about 0.1 KeV/amu. The charge-transfer cross section is determined by measuring the intensity ratio of the product ions to the parent ions after the charge-transfer reactions occur in the reflection drift tube of the RTOFMS. First, a calibration measurement of C{dollar}\sp{2+}{dollar} with H{dollar}\sb2{dollar} is carried out and the result agrees with previous measurements by other research groups. Then, a first-time measurement of Si{dollar}\sp{3+}{dollar} with He at silicon ion energy of 0.16 KeV/amu is carried out. The single electron charge-transfer cross section of this reaction is {dollar}\rm 1.27({\pm}0.19)\times 10\sp{-15} cm\sp2.{dollar}.

Keywords

Ablation; Charge; Charge Transfer; Cross; Flight; Ion; Laser; Mass; Measurement; Measurements; Reflection; Section; Source; Sources; Spectrometer; Time; Transfer; Charge Transfer

Controlled Subject

Nuclear physics; Molecular dynamics; Plasma astrophysics

File Format

pdf

File Size

2375.68 KB

Degree Grantor

University of Nevada, Las Vegas

Language

English

Permissions

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Identifier

https://doi.org/10.25669/iotp-k3hx


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