Robustness Measure for Hypercube networks

Authors

Shahram Latifi, University of Nevada, Las VegasFollow
Suresh Rai, Louisiana State University

Document Type

Conference Proceeding

Publication Date

8-16-1993

Publication Title

Proceedings of the 36th Midwest Symposium on Circuits and Systems, 1993

Publisher

IEEE

Volume

1

First page number:

546

Last page number:

549

Abstract

This paper addresses a constrained two-terminal reliability measure referred to as Distance Reliability (DR) between two nodes s and t of Hamming distance H(s,t). in hypercube networks (B_n). The shortest distance restriction guarantees optimal communication delay between processors and high link/node utilization across the network. Moreover, it provides a measure for the robustness of the network. In particular, when H(s,t)=n in B_n, DR will yield the probability of degradation in the diameter, a concept which directly relates to fault-diameter. The paper proposes two schemes to evaluate DR in B_n. The first scheme uses a combinatorial approach by limiting the number of faulty components to (2H(s,t)-2), while the second outlines paths of length H(s,t) and, then, generates a recursive closed-form solution to compute DR. The theoretical results have been verified by simulation. The discrepancy between the theoretical and simulation results is in most cases below 1% and in the worst case 4.6%

Disciplines

Electrical and Computer Engineering | Engineering | Signal Processing | Systems and Communications

Language

English

Permissions

Use Find in Your Library, contact the author, or interlibrary loan to garner a copy of the item. Publisher policy does not allow archiving the final published version. If a post-print (author's peer-reviewed manuscript) is allowed and available, or publisher policy changes, the item will be deposited.

Repository Citation

Latifi, S., Rai, S. (1993). Robustness Measure for Hypercube networks. Proceedings of the 36th Midwest Symposium on Circuits and Systems, 1993, 1 546-549. IEEE.