Title

Robustness measure for hypercube networks

Document Type

Conference Proceeding

Publication Date

8-16-1993

Publication Title

Proceedings of the 36th Midwest Symposium on Circuits and Systems, 1993

Publisher

IEEE

Volume

1

First page number:

546

Last page number:

549

Abstract

This paper addresses a constrained two-terminal reliability measure referred to as Distance Reliability (DR) between two nodes s and t of Hamming distance H(s,t). in hypercube networks (Bn). The shortest distance restriction guarantees optimal communication delay between processors and high link/node utilization across the network. Moreover, it provides a measure for the robustness of the network. In particular, when H(s,t)=n in Bn, DR will yield the probability of degradation in the diameter, a concept which directly relates to fault-diameter. The paper proposes two schemes to evaluate DR in Bn. The first scheme uses a combinatorial approach by limiting the number of faulty components to (2H(s,t)-2), while the second outlines paths of length H(s,t) and, then, generates a recursive closed-form solution to compute DR. The theoretical results have been verified by simulation. The discrepancy between the theoretical and simulation results is in most cases below 1% and in the worst case 4.6%

Disciplines

Electrical and Computer Engineering | Engineering | Signal Processing | Systems and Communications

Language

English

Permissions

Use Find in Your Library, contact the author, or interlibrary loan to garner a copy of the item. Publisher policy does not allow archiving the final published version. If a post-print (author's peer-reviewed manuscript) is allowed and available, or publisher policy changes, the item will be deposited.

Identifier

DOI: http://dx.doi.org/10.1109/MWSCAS.1993.342988

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