Characterization of Pentavalent and Hexavalent Americium Complexes in Nitric Acid Using X-ray Absorption Fine Structure Spectroscopy and First-principles Modeling

Authors

Catherine Riddle, Idaho National LaboratoryFollow
Ken Czerwinski, University of Nevada, Las VegasFollow
Eunja Kim, University of Nevada, Las VegasFollow
Patricia Paviet, Department of Energy
Philippe Weck, Sandia National LaboratoriesFollow
Frederic Poineau, University of Nevada, Las VegasFollow
Steven Conradson, Synchrotron Soleil Laboratory,

Document Type

Article

Publication Date

1-1-2016

Publication Title

Journal of Radioanalytical and Nuclear Chemistry

Volume

309

Issue

3

First page number:

1087

Last page number:

1095

Abstract

The speciation of pentavalent and hexavalent americium (Am) complexes in nitric acid have been studied by X-ray absorption fine structure spectroscopy, UV–visible spectroscopy, and density functional theory. Calculated bond distances for the Am(VI) complex are in reasonable agreement with EXAFS data and suggest the presence of a mixture of AmO2 + and AmO2 2+ as well as a slightly higher kinetic stability for Am(VI) compared to Am(V). © 2016, Akadémiai Kiadó, Budapest, Hungary.

Keywords

Acidic solution; Americium; DFT; Higher oxidation states; XAFS

Language

English

Repository Citation

Riddle, C., Czerwinski, K., Kim, E., Paviet, P., Weck, P., Poineau, F., Conradson, S. (2016). Characterization of Pentavalent and Hexavalent Americium Complexes in Nitric Acid Using X-ray Absorption Fine Structure Spectroscopy and First-principles Modeling. Journal of Radioanalytical and Nuclear Chemistry, 309(3), 1087-1095.
http://dx.doi.org/10.1007/s10967-016-4704-x