Precision Measurements of the Total Photoionization Cross Sections of He, Ne, Ar, Kr, and Xe

Authors

J.A. R. Samson, Behlen Laboratory of PhysicsFollow
Wayne C. Stolte, University of Nevada, Las VegasFollow

Document Type

Article

Publication Date

5-2002

Publication Title

Journal of Electron Spectroscopy and Related Phenomena

Volume

123

Issue

2-3

First page number:

265

Last page number:

276

Abstract

Absolute photoionization cross-sections for the rare gases have been measured from threshold to 125 eV with an accuracy of ±1 to 3% and are presented in both tabular and graphical form. These data are compared with the optical oscillator strength measurements of Brion and co-workers, who used the Dipole (e, e) collision technique.

Keywords

Argon; Gases; Rare; Helium; Krypton; Neon; Photochemistry; Photoionization cross-sections; Xenon

Disciplines

Analytical Chemistry | Atomic, Molecular and Optical Physics | Biological and Chemical Physics | Physical Chemistry

Language

English

Permissions

Use Find in Your Library, contact the author, or use interlibrary loan to garner a copy of the article. Publisher copyright policy allows author to archive post-print (author’s final manuscript). When post-print is available or publisher policy changes, the article will be deposited

Repository Citation

Samson, J. R., Stolte, W. C. (2002). Precision Measurements of the Total Photoionization Cross Sections of He, Ne, Ar, Kr, and Xe. Journal of Electron Spectroscopy and Related Phenomena, 123(2-3), 265-276.