Characterization of Sulfur Bonding in CdS:O Buffer Layers for CdTe-based thin-film Solar Cells
Document Type
Article
Publication Date
8-5-2015
Publication Title
ACS Applied Material Interfaces
Volume
7
Issue
30
First page number:
16382
Last page number:
16386
Abstract
On the basis of a combination of X-ray photoelectron spectroscopy and synchrotron-based X-ray emission spectroscopy, we present a detailed characterization of the chemical structure of CdS:O thin films that can be employed as a substitute for CdS layers in thin-film solar cells. It is possible to analyze the local chemical environment of the probed elements, in particular sulfur, hence allowing insights into the species-specific composition of the films and their surfaces. A detailed quantification of the observed sulfur environments (i.e., sulfide, sulfate, and an intermediate oxide) as a function of oxygen content is presented, allowing a deliberate optimization of CdS:O thin films for their use as alternative buffer layers in thin-film photovoltaic devices.
Keywords
alternative buffer layers; Cd S; Cd Te; solar cells; XPS
Repository Citation
Duncan, D. A.,
Kephart, J. M.,
Horsley, K.,
Blum, M.,
Mezhert, M.,
Weinhardt, L.,
Häming, M.,
Wilks, R. G.,
Hofmann, T.,
Yang, W.,
Bär, M.,
Sampath, W. S.,
Heske, C.
(2015).
Characterization of Sulfur Bonding in CdS:O Buffer Layers for CdTe-based thin-film Solar Cells.
ACS Applied Material Interfaces, 7(30),
16382-16386.
http://dx.doi.org/10.1021/acsami.5b03503