Document Type

Conference Proceeding

Abstract

This paper addresses the development of a flexible low-cost automated scale highway (FLASH) laboratory which is intended to serve as a catalyst for accelerating the development of many intelligent vehicle highway system (IVHS) concepts. It also highlights the significance of the laboratory for the research, evaluation, and testing of automated highway system (AHS) configurations, architectures, designs and technologies. This laboratory, using small scale standardized vehicles will serve as a test bed for the economical development and evaluation of various hardware, software, and management systems before full scale testing and deployment. The laboratory will provide the capability to test day and night, and will be immune to adverse weather conditions. It will be able to evaluate and test situations from various points of view including control, communication, routing, sensing, etc., which otherwise would be very expensive and dangerous-if human operators are involved-to test on test sites like Smart Road, a proposed testbed for ITS (IVHS) technology in Virginia. The development of this laboratory complements the development and utilization of the Smart Road, and is in harmony with the mission of the Center for Transportation Research.

Disciplines

Civil Engineering | Controls and Control Theory | Transportation | Urban Studies and Planning

Comments



Permissions

©1995 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

Publisher Citation

Kachroo, Pushkin, Kaan Ozbay, Robert G. Leonard, and Cem Unsal. "Flexible low-cost automated scaled highway (FLASH) laboratory for studies on automated highway systems." In Systems, Man and Cybernetics, 1995. Intelligent Systems for the 21st Century., IEEE International Conference on, vol. 1, pp. 771-776. IEEE, 1995.