Auger-electron–Photoion Coincidence Measurements of Atoms and Molecules Using X-ray Synchrotron Radiation
Journal of Electron Spectroscopy and Related Phenomena
First page number:
Last page number:
As the availability of intense beams of hard X-rays from synchrotron-radiation sources has increased, interest in the fundamental interactions of X-rays with deep core electrons in free atoms and molecules has undergone a resurgence. These powerful X-ray sources have led to more highly differential measurements, providing ever more detailed information about atomic and molecular structure and dynamics. One such improvement in measurement technique is the application of electron—ion coincidence spectroscopy, which only recently has been extended to studies of deep core levels. A collaborative research program focusing on the dynamics of photoionization and Auger decay following hard X-ray absorption by atoms and small molecules, as well as subsequent fragmentation in the molecular case, has been ongoing at the National Synchrotron Light Source for the past few years. This report summarizes the capabilities of the program by reviewing results on argon near the K edge, and discusses briefly newer measurements on xenon and a few sulfur- and chlorine-containing molecules.
Argon; Auger effect; Electrons; Photoionization; X-rays
Analytical Chemistry | Atomic, Molecular and Optical Physics | Biological and Chemical Physics | Elementary Particles and Fields and String Theory | Physical Chemistry
Use Find in Your Library, contact the author, or use interlibrary loan to garner a copy of the article. Publisher copyright policy allows author to archive post-print (author’s final manuscript). When post-print is available or publisher policy changes, the article will be deposited
Lindle, D. W.,
Manner, W. L.,
Levin, J. C.,
Sellin, I. A.
Auger-electron–Photoion Coincidence Measurements of Atoms and Molecules Using X-ray Synchrotron Radiation.
Journal of Electron Spectroscopy and Related Phenomena, 67(2),