Correlation between hot spots and 3-D defect structure in single and polycrystalline high-explosive materials

Document Type

Conference Proceeding

Publication Date

1-1-2017

Publication Title

Procedia Engineering

Publisher

Elsevier Ltd

Volume

204

First page number:

360

Last page number:

366

Abstract

A novel approach that spatially identifies inhomogeneities from microscale (defects, con-formational disorder) to mesoscale (voids, inclusions) is developed using synchrotron x-ray methods: tomography, Lang topography, and micro-diffraction mapping. These techniques provide a non-destructive method for characterization of mm-sized samples prior to shock experiments. These characterization maps can be used to correlate continuum level measurements in shock compression experiments to the mesoscale and microscale structure. Specifically examined is a sample of C4. We show extensive conformational disorder in gamma-RDX, which is the main component. Further, we observe that the minor HMX-component in C4 contains at least two different phases: alpha- and beta-HMX in spatially variable amounts. PETN sprayed film was found to be very homogeneously fine grained with modest preferred orientation of crystallites and modest rotational disorder of nitro-groups. © 2017 The Authors. Published by Elsevier Ltd.

Language

english

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