Location

Marjorie Barrick Museum Auditorium

Start Date

28-2-2012 7:30 AM

End Date

28-2-2012 5:00 PM

Description

UNLV EM DOT

•Patented
–Patent Number: 7,482,814 [1/27/2009]
•Novel Differential Dot
–Wide bandwidth & Matched
–Symmetric, shielded sensor
–Measures the E and B fields at a single point in space simultaneously
•Transient Calibration Technique Developed –Excellent Agreement
–Low inductance test stand –relatively uniform B-field
–Low capacitance test stand –relatively uniform E-field
–Test stand is the limiting factor at this time

Disciplines

Electromagnetics and Photonics | Science and Technology Studies

Language

English

Comments

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Feb 28th, 7:30 AM Feb 28th, 5:00 PM

UNLV EM-Dot Research, Highlights of Improvised Electric Detonator (Wire Melt) Research, and Comments on Basic Research with UNLV Non-Equilibrium Plasma Pinch

Marjorie Barrick Museum Auditorium

UNLV EM DOT

•Patented
–Patent Number: 7,482,814 [1/27/2009]
•Novel Differential Dot
–Wide bandwidth & Matched
–Symmetric, shielded sensor
–Measures the E and B fields at a single point in space simultaneously
•Transient Calibration Technique Developed –Excellent Agreement
–Low inductance test stand –relatively uniform B-field
–Low capacitance test stand –relatively uniform E-field
–Test stand is the limiting factor at this time