X-Ray Absorption Fine Structure Spectroscopic Study of (NH4)(2)ReF6

Authors

Frederic Poineau, University of Nevada, Las VegasFollow
James Louis‑Jean, University of Nevada, Las VegasFollow
Harry Jang, University of Nevada, Las VegasFollow
Cassara Higgins, University of Nevada, Las VegasFollow
Samundeeswari Mariappan Balasekaran, University of Nevada, Las VegasFollow
David Hatchett, University of Nevada, Las VegasFollow
Alfred P. Sattelberger, University of Nevada, Las Vegas

Document Type

Article

Publication Date

10-19-2019

Publication Title

SN Applied Sciences

Volume

1

Issue

11

First page number:

1

Last page number:

7

Abstract

The (NH4)(2)ReF6 (X= F, Cl, Br, I) salts have been investigated by x-ray absorption fine structure spectroscopy. The Re-F distance determined by EXAFS in (NH4)(2)ReF6 (i.e., 1.95 angstrom) is in good agreement with the one determined by single crystal x-ray diffraction in A(2)ReF(6) salts (A= K, Rb, Cs). The XANES studies of (NH4)(2)ReF6 (X= F, Cl, Br, I) indicates that the positions of the absorption edge and of the white line are shifted to higher energy when moving from Ito F. These shifts have been explained in terms of the crystal field splitting parameter and covalent charge carried by the Re atoms. Calculations of the XANES spectra of the ReX62- (X= F, CI, Br, I) anions at the Re-L-3 edge have been performed and the calculated shifts and intensity of the white lines reproduce well the experimental observations.

Keywords

Rhenium; Halogen; Fluorine; X-ray absorption fine structure spectroscopy

Disciplines

Chemistry | Physical Sciences and Mathematics | Radiochemistry

Language

English

Repository Citation

Poineau, F., Louis‑Jean, J., Jang, H., Higgins, C., Mariappan Balasekaran, S., Hatchett, D., Sattelberger, A. P. (2019). X-Ray Absorption Fine Structure Spectroscopic Study of (NH4)(2)ReF6. SN Applied Sciences, 1(11), 1-7.
http://dx.doi.org/10.1007/s42452-019-1464-6