Parity-unfavored Transitions in Resonant Photoemission From Ar, Kr, and Xe: Experimental and Theoretical Results

Document Type

Article

Publication Date

1990

Publication Title

Journal of Electron Spectroscopy and Related Phenomena

Volume

51

First page number:

397

Last page number:

406

Abstract

High-resolution angle-resolved electron spectroscopy with synchrotron radiation has been used to study the angular distributions of resonant-Auger processes near the core-level thresholds Ar2p, Kr3d and Xe4d. Angular-distribution parameters (β) were measured for all resolved peak in the electron spectra and large negative values of β were found for some peaks. A quantitative method for calculating the angular-distribution parameters is described and results of calculations for the Ar2p3/2→4s resonant-Auger spectrum are compared with the experimental results.

Keywords

Atomic orbitals; Auger effect; Electron configuration; Electron spectroscopy; Gases; Rare; Synchrotron radiation

Disciplines

Analytical Chemistry | Atomic, Molecular and Optical Physics | Biological and Chemical Physics | Elementary Particles and Fields and String Theory | Physical Chemistry

Language

English

Permissions

Use Find in Your Library, contact the author, or use interlibrary loan to garner a copy of the article. Publisher copyright policy allows author to archive post-print (author’s final manuscript). When post-print is available or publisher policy changes, the article will be deposited

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