Award Date
1-1-1989
Degree Type
Thesis
Degree Name
Master of Science (MS)
Department
Electrical and Computer Engineering
Number of Pages
91
Abstract
A two-dimensional numerical model of the high electron mobility transistor (HEMT) with consideration of quantization in the channel is presented. In this model, the spatial spread of the electron concentration in the quantum well normal to the heterojunction is taken into consideration by solving Schrodinger's and Poisson's equations self-consistently. The Boltzmann transport equation in the form of a current continuity equation and an energy transport equation is solved to obtain the transient transport behavior. Transport of carriers takes place in two layers in the GaAs region: the lowest subband of the quantum well and a non-quantized bulk layer; The simulation program investigates the effects on the overall performance of the device due to variation of the gate length and the impurity doping concentration in AlGaAs. A reduction in the gate length results in an increase of the drain current which is partly due to a shift in the threshold voltage. (Abstract shortened with permission of author.).
Keywords
Dimensional; Electron; High; Mobility; Model; Numerical Transistor
Controlled Subject
Computer science
File Format
File Size
2324.48 KB
Degree Grantor
University of Nevada, Las Vegas
Language
English
Permissions
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Repository Citation
Ng, Sze-Him, "A two-dimensional numerical model of the high electron mobility transistor" (1989). UNLV Retrospective Theses & Dissertations. 28.
http://dx.doi.org/10.25669/r07q-alao
Rights
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