Award Date

8-1-2021

Degree Type

Thesis

Degree Name

Master of Science (MS)

Department

Physics and Astronomy

First Committee Member

Joshua Island

Second Committee Member

Ashkan Salamat

Third Committee Member

Bernard Zygelman

Fourth Committee Member

Clemens Heske

Number of Pages

72

Abstract

Terahertz time-domain spectroscopy (THz-TDS) allows the direct measurement of optical and charge carrier properties of materials in a region of the electromagnetic spectrum inaccessible to most other spectroscopic techniques. We have adapted the technique to an on-chip arrangement that allows us to measure these properties in nanoscale materials with dimensions below the diffraction limit. In this thesis, we present the operation of instruments and the mechanics behind performing on-chip terahertz time-domain spectroscopy. Three materials were tested to confirm the capabilities of our system to measure THz radiation: indium selenide (InSe), radiation-damaged silicon-on-sapphire (RD-SOS), and an erbium arsenide:gallium arsenide superlattice. Preliminary testing with InSe failed to produce a measurable terahertz spectrum, while RD-SOS and the superlattice produced a bandwidth of 0.4 THz and 0.25 THz, respectively. While RD-SOS has a wider bandwidth, the radiation generated from the superlattice is stronger by a factor of thirty. We discuss adjustments to the fabrication process that may improve their bandwidths, and close with the intents to use this measurement to test for phenomena unique to two-dimensional systems.

Keywords

bandwidth; experimental physics; two-dimensional systems; ultrafast

Disciplines

Condensed Matter Physics | Physics

File Format

pdf

File Size

1624 KB

Degree Grantor

University of Nevada, Las Vegas

Language

English

Rights

IN COPYRIGHT. For more information about this rights statement, please visit http://rightsstatements.org/vocab/InC/1.0/

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