Soft X-ray and Electron Spectroscopy: A Unique "Tool Chest" to Characterize the Chemical and Electronic Properties of Surfaces and Interfaces

Authors

Marcus Bär, Helmholtz-Zentrum Berlin für Materialien und Energie GmbHFollow
Lothar Weinhardt, University of Nevada, Las VegasFollow
Clemens Heske, University of Nevada, Las VegasFollow

Document Type

Book Section

Publication Date

1-1-2016

Publication Title

Advanced Characterization Techniques for Thin Film Solar Cells: Second Edition

Publisher

wiley

Volume

2017-02-02

First page number:

501

Last page number:

522

Abstract

[No abstract available]

Language

English

Repository Citation

Bär, M., Weinhardt, L., Heske, C. (2016). Soft X-ray and Electron Spectroscopy: A Unique "Tool Chest" to Characterize the Chemical and Electronic Properties of Surfaces and Interfaces. Advanced Characterization Techniques for Thin Film Solar Cells: Second Edition, 2017-02-02 501-522. wiley.
http://dx.doi.org/10.1002/9783527699025.ch18