Soft X-ray and Electron Spectroscopy: A Unique "Tool Chest" to Characterize the Chemical and Electronic Properties of Surfaces and Interfaces
Document Type
Book Section
Publication Date
1-1-2016
Publication Title
Advanced Characterization Techniques for Thin Film Solar Cells: Second Edition
Publisher
wiley
Volume
2017-02-02
First page number:
501
Last page number:
522
Abstract
[No abstract available]
Language
English
Repository Citation
Bär, M.,
Weinhardt, L.,
Heske, C.
(2016).
Soft X-ray and Electron Spectroscopy: A Unique "Tool Chest" to Characterize the Chemical and Electronic Properties of Surfaces and Interfaces.
Advanced Characterization Techniques for Thin Film Solar Cells: Second Edition, 2017-02-02
501-522.
wiley.
http://dx.doi.org/10.1002/9783527699025.ch18